基本情報技術者試験

SET STANDARD INTERNATIONAL APPLIED TECHNOLOGY

About this app

WHO IT IS FOR
- Anyone preparing for the FE examination
- IT and information-systems students studying alongside their coursework
- Anyone taking the qualification for a job, a career change or an internal certification
- Anyone who wants to study offline in short sessions, without using data
- Anyone who has failed once and wants to work on their weak areas

WHAT IS INCLUDED

Questions: 2,520 four-choice questions, all explained
- Subject A (Knowledge): 1,012
Basic Theory 97 (Basic Theory 49 / Algorithms & Programming 48)
Computer System 337 (Software 91 / Computer Components 88 / System Components 86 / Hardware 72)
Technical Elements 216 (Database 49 / Information Media 48 / Network 48 / User Interface 47 / Security 24)
Development Technology 45 (System Development Technology 23 / Software Dev Management 22)
Management 125 (Project Management 43 / Service Management 41 / System Audit 41)
Strategy 192 (Legal Affairs 38 / Business Strategy 29 / Business Industry 27 / System Strategy 26 / System Planning 25 / Technology Strategy 24 / Corporate Activities 23)
- Subject B (Skills): 1,508
Algorithms & Programming 982 / Information Security 526

Glossary: 218 terms covering basic theory, networks, databases, security, management and strategy, each defined. Filter by importance (essential / important / reference) for last-minute revision.

MAIN FEATURES
1. Drill mode - choose a field and focus on it alone, with the answer and explanation after every question.
2. Free practice - pick the subject, field and difficulty, or search by keyword. Selected questions start together as your own set.
3. Mock exam mode
- Subject A: 60 questions / 90 minutes, the same count and time as the real examination.
- Subject B: 20 questions / 100 minutes, focused on long-form algorithm questions.
Countdown timer, pause/resume, answered / unanswered overview.
4. Results and progress - automatic scoring with estimated score, per-field scores, accuracy, time taken and a pass/fail indication. Past attempts can be revisited.
5. Learning analysis - accuracy by field shows your weak and strong areas. Consecutive study days and total answers are recorded.
6. Glossary - keyword search and importance filter.
7. Japanese / English interface and dark mode - switch language at any time, with questions and explanations in both.

WHY THIS APP
- Fully offline: all content is stored inside the app, so it works with no signal and uses no data.
- No account or login, and no ads, analytics or in-app purchases.
- Your study data stays on your device and is never sent anywhere. See the Privacy Policy.

EXAM INFORMATION (FOR REFERENCE)
- Administrator: Information-technology Promotion Agency, Japan (IPA)
- Format: CBT (taken on a computer)
- Subject A: 60 questions / 90 minutes, four-choice
- Subject B: 20 questions / 100 minutes, multiple-select
- Pass standard: 600 points out of 1,000 in each subject
Standards and scope may change; check the latest official information.

PLEASE NOTE
- This is an unofficial study app. The questions, explanations and glossary are original study materials created for learning purposes, not reproductions of actual examination questions.
- This app is independent and is not affiliated with, endorsed by or supervised by any government body, examination administrator or certification authority. Names and terms are used for identification only and belong to their respective owners.
- This app does not guarantee that you will pass.

PRIVACY
This app does not collect personal information. Results, progress and study history stay on your device, are never transmitted externally, and can be deleted any time from Settings.

Study for the FE examination in the spare minutes of every day.

What’s new

- 2,520 practice questions, all with explanations
Subject A (Knowledge) 1,012 / Subject B (Skills) 1,508
- Glossary of 218 key terms by importance
- Drill mode by field, free practice with filters
- Mock exams: Subject A 60 Q / 90 min, Subject B 20 Q / 100 min
- Auto scoring and weak-area analysis