An Overlapped Sub-array for Limited Scan Application

· Air Force Cambridge Research Laboratories, Air Force Systems Command, United States Air Force
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The report describes a new technique for producing an overlapped sub-array pattern by higher order mode coupling between nearest neighbor phased array elements. Theoretical and experimental results are compared, and practical circuits described for one plane of scan. The Appendix presents a circuit for scanning in two planes. (Author).

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Rohkem autorilt Robert J. Mailloux

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