Surface and Interface Characterization by Electron Optical Methods

· Nato ASI Subseries B 第 16 冊 · Springer Science & Business Media
電子書
319
頁數

關於這本電子書

The importance of real space imaging and spatially-resolved spectroscopy in many of the most significant problems of surface and interface behaviour is almost self evident. To join the expertise of the tradi tional surface scientist with that of the electron microscopist has however been a slow and difficult process. In the past few years remarkable progress has been achieved, including the development of new techniques of scanning transmission and reflection imaging as well as low energy microscopy, all carried out in greatly improved vacuum conditions. Most astonishing of all has been the advent of the scanning tunneling electron microscope providing atomic resolution in a manner readily compatible with most surface science diagnostic procedures. The problem of beam damage, though often serious, is increasingly well understood so that we can assess the reliability and usefulness of the results which can now be obtained in catalysis studies and a wide range of surface science applications. These new developments and many others in more established surface techniques are all described in this book, based on lectures given at a NATO Advanced Study Institute held in Erice, Sicily, at Easter 1987. It is regretted that a few lectures on low energy electron diffraction and channeling effects could not be included. Fifteen lecturers from seven different Countries and 67 students from 23 Countries and a wide variety of backgrounds attended the school.

為這本電子書評分

請分享你的寶貴意見。

閱讀資訊

智能手機和平板電腦
請安裝 Android 版iPad/iPhone 版「Google Play 圖書」應用程式。這個應用程式會自動與你的帳戶保持同步,讓你隨時隨地上網或離線閱讀。
手提電腦和電腦
你可以使用電腦的網絡瀏覽器聆聽在 Google Play 上購買的有聲書。
電子書閱讀器及其他裝置
如要在 Kobo 等電子墨水裝置上閱覽書籍,你需要下載檔案並傳輸到你的裝置。請按照說明中心的詳細指示,將檔案傳輸到支援的電子書閱讀器。