关于此电子书
Design for Reliability provides engineers and managers with a range of tools and techniques for incorporating reliability into the design process for complex systems. It clearly explains how to design for zero failure of critical system functions, leading to enormous savings in product life-cycle costs and a dramatic improvement in the ability to compete in global markets.
Readers will find a wealth of design practices not covered in typical engineering books, allowing them to think outside the box when developing reliability requirements. They will learn to address high failure rates associated with systems that are not properly designed for reliability, avoiding expensive and time-consuming engineering changes, such as excessive testing, repairs, maintenance, inspection, and logistics.
Special features of this book include:
- A unified approach that integrates ideas from computer science and reliability engineering
- Techniques applicable to reliability as well as safety, maintainability, system integration, and logistic engineering
- Chapters on design for extreme environments, developing reliable software, design for trustworthiness, and HALT influence on design
Design for Reliability is a must-have guide for engineers and managers in R&D, product development, reliability engineering, product safety, and quality assurance, as well as anyone who needs to deliver high product performance at a lower cost while minimizing system failure.
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作者简介
DEV RAHEJA is President of Raheja Consulting, Inc. For over thirty years, he has served clients in numerous industries, including aerospace, medical devices, auto, and consumer products. Raheja is also the coauthor of Assurance Technologies Principles and Practices, Second Edition (Wiley).
LOUIS J. GULLO is Senior Principal Systems Engineer at Raytheon Missile Systems in Tucson, Arizona. A retired U.S. Army Lieutenant Colonel, Gullo has more than thirty years' experience in military, space, and commercial programs. He is a Senior Member of the IEEE and Chair of the IEEE Reliability Society Standards Committee.
