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Due to the spectacular growth of electronic systems and the steady demand for new services with increased functionality, the development of more efficient measurement techniques has become of paramount importance. This practical resource details the cutting-edge Modulated Scatterer Technique, which offers a low-invasive and rapid method for testing and maesuring systems and equipment used in a wide range of electronic engineering applications. Extensively refrenced with 125 illustrations and 100 equations.
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Jean-Charles Bolomey received his Ph.D. at the University of Paris. Dr. Bolomey is the director of the Service of Electromagnetism at SUPELEC and a professor at the University of Paris, where he received his Ph.D for a thesis on resonant scattering. He created the Technical Applications Society for Microwave Imagery (SATIMO).
Fred E. Gardiol holds a M.S. in electrical engineering from the Massachusetts Institute of Technology and a Ph.D. in applied science from the Catholic University of Louvain, Belgium. He has retired from his position of professor and director at the Laboratory of Electromagnetism and Acoustics (LEMA) of the Swiss Federal Institute of Technology (EPFL).
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