NEC Corporation Patent Landscape Analysis – January 1, 1994 to December 31, 2013

Reiner E. Jargosch · Joseph Jurich

thg 6 2014 · IPGenix LLC

Giới thiệu về sách điện tử này

The following analysis illustrates the underlying trends and relationships of U.S. issued patents of the subject company.  The analysis employs two frequently used patent classification methods:  US Patent Classification (UPC) and International Patent Classification (IPC).  Aside from assisting patent examiners in determining the field of search for newly submitted patent applications, the two classification methods play a pivotal role in the characterization and analysis of technologies contained in collections of patent data.  The analysis also includes the company’s most prolific inventors, top cited patents as well as foreign filings by technology area. 

Giới thiệu tác giả

The authors each have more than 15 years of experience in Intellectual Property Asset Management including patent analytics, competitive intelligence and  licensing opportunity development.  They have advised major global corporations, universities and government laboratories on numerous intellectual property monetization projects. The analysis in this report was generated by a proprietary patent analytics tool developed by the authors.