After having recalled the main principles in RFID technology and its current challenges notably with the emergence of Internet of Things or the smart connected environments, the purpose is to focus on the presence of nonlinearities produced by the nonlinear circuits of RFID chips: effects, nuisances and solutions but also and especially use of the phenomena.
The presentation covers all aspects from the characterization of the nonlinear behavior of RFID tags and the associated platforms (distinguishing conducted and radiated measurement) to the design of new types of tags where nonlinearities are exploited in order to offer new capabilities or enhanced performance.
Gianfranco Andía is a Doctor in Radio Frequency from Grenoble Institute of Technology, France, and an RF engineer in the RFID industry.
Yvan Duroc is Full Professor at the University Claude Bernard Lyon 1, France.
Smail Tedjini is a URSI Fellow and IEEE Senior Member. He has been Professor at Grenoble Institute of Technology since 1996.