Surface Metrology for Micro- and Nanofabrication

Wei Gao

ಅಕ್ಟೋ 2020 · Elsevier

ಈ ಇ-ಪುಸ್ತಕದ ಕುರಿತು

Surface Metrology for Micro- and Nanofabrication presents state-of-the-art measurement technologies for surface metrology in fabrication of micro- and nanodevices or components. This includes the newest general-purpose scanning probe microscopes, and both contact and non-contact surface profilers. In addition, the book outlines characterization and calibration techniques, as well as in-situ, on-machine, and in-process measurements for micro- and nanofabrication.

• Provides materials scientists and engineers with an informed overview of the state-of-the-art in surface metrology
• Helps readers select and design the optimized surface metrology systems and carry out proper surface metrology practices in the fabrication of micro/nano-devices and components
• Assesses the best techniques for repairing micro-defects

ಲೇಖಕರ ಕುರಿತು

Prof. Wei Gao is the Chair of the Precision Nanometrology Laboratory and Director of the Research Center for Precision Nanosystems at the Department of Fine Mechanics in the Graduate School of Engineering, Tohoku University, Japan. His research focuses on precision engineering, precision metrology, micro/nano-nanometrology, optical sensors, surface metrology, on-machine and in-process measurement, and motion measurement.