Happy About Global Software Test Automation: A Discussion of Software Testing for Executives

Hung Quoc Nguyen · Michael Hackett · Brent K. Whitlock

ene 2006 · Happy About

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Testing problems are difficult, expensive, and hard to understand. Most software companies have bugs escape the testing cycles and reach customers. How can some of the inherent problems with software testing be eliminated? This book addresses this fundamental issue and helps the reader understand the high-level elements necessary to better execute software test automation and outsourcing initiatives. Although your team may know about test automation, have they ever executed efficiently to meet the goals of faster delivery, better quality, and saving money? If not, this book is a must read. The goal of the book is to help make testing less of an albatross and to provide a guide to software testing success. If done right, you can: Increase quality, Decrease cost and Increase speed to market. Co-Apple founder Steve Wozniak says that Software is complex but I'm tired of finding bug after bug that a 5th grader wouldn't have turned in. Virtually every technical product these days includes a lot of software. It's a rare engineer that can write nearly perfect code. Methodical and thorough testing of software is the key to quality products that do what the user expects. Read this book to learn what you need to do

Acerca del autor

Hung Nguyen is CEO, President, and Founder of LogiGear and is responsible for the company's strategic direction and executive business management. He's been a leading innovator in software testing, test automation, testing tool solutions and testing education programs for the last two decades. Mr. Nguyen is coauthor of the top-selling book in the software testing field, Testing Computer Software (Wiley, 2nd ed. 2002) and other publications including Testing Applications on the Web (Wiley, 2nd ed. 2003). His experience over the past two decades includes leadership roles in software development, quality, product and business management at Spinnaker, PowerUp, Electronic Arts, Palm Computing and other leading companies. A frequent speaker at industry events and a contributor to many industry publications, Nguyen also teaches software testing at LogiGear University, and at the University of California Berkeley Extension and Santa Cruz Extension in San Francisco and Silicon Valley. Michael Hackett is Michael Hackett co-founded LogiGear in 1994 and leads the company's LogiGear University training operations division, setting the standard in software testing education programs for many of the world's leading software development organizations. Mr. Hackett is coauthor of the popular Testing Applications on the Web (Wiley, 2nd ed. 2003), and has helped many clients produce, test and deploy applications ranging from business productivity to educational multimedia across multiple platforms and multiple language editions. His clients have included Palm Computing, Oracle, CNET, Electronics for Imaging, The Learning Company, and PC World. Prior to co-founding LogiGear, Mr. Hackett managed QA teams at The Well, Adobe Systems, and PowerUp Software. He holds a Bachelor of Science in Engineering from Carnegie-Mellon University. Brent K. Whitlock is currently a Program Manager at Digidesign, a division of Avid Technology, Inc. Prior to this, he was Director of Optical Systems Research and Business Development at RSoft Design Group, Inc., where he initiated and led the development and commercialization of several optical communication system simulation software packages including LinkSIM, ModeSYS, and OptSim 4, which won the Lightwave OFC/NFOEC 2005 Attendees Choice Award. He has also secured and served as Principal Investigator on federally funded SBIR, STTR, and NIST ATP research contracts. Dr. Whitlock earned his BS, MS, and PhD all in Electrical Engineering from the University of Illinois at Urbana-Champaign. Dr. Whitlock has co-authored over 30 technical papers and articles. He is a Sr. Member of the IEEE and Chair of the Santa Clara Valley chapter of IEEE LEOS.