ამ ელწიგნის შესახებ
- Discusses interferometry, speckle metrology, moiré phenomenon, photoelasticity, and microscopy
- Describes the different principles used to measure the refractive indices of solids, liquids, and gases
- Presents methods for measuring curvature, focal length, angle, thickness, velocity, pressure, and length
- Details techniques for optical testing as well as for making fiber optic- and MEMS-based measurements
- Depicts a wave propagating in the positive z-direction by ei(ωt – kz), as opposed to ei(kz – ωt)
Featuring exercise problems at the end of each chapter, Introduction to Optical Metrology provides an applied understanding of essential optical measurement concepts, techniques, and procedures.
ავტორის შესახებ
Rajpal S. Sirohi, Ph.D, is currently chair professor of the Physics Department at Tezpur University, India, and senior editor of Optical Engineering. Previously, he was director of the Indian Institute of Technology Delhi; vice-chancellor of Barkatullah University, Bhopal; vice-chancellor of Shobhit University, Meerut; and vice-chancellor of Amity University, Jaipur. He also served in various capacities at the Indian Institute of Science, Bangalore; Indian Institute of Technology Madras, Chennai; Case Western Reserve University, Cleveland, Ohio, USA; Rose-Hulman Institute of Technology, Terre Haute, Indiana, USA; Institute for Advanced Studies, University of Malaya, Malaysia; University of Namibia; National University of Singapore; and École Polytechnique Fédérale de Lausanne, Switzerland. Widely published and highly decorated, Professor Sirohi is or has been a fellow, honorary fellow, invited fellow, member, board member, and former president of numerous scientific academies, associations, committees, societies, and journals.
