關於這本電子書
This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fluorescence X-ray spectroscopy, and popular surface analysis techniques (XPS and SIMS). Finally, vibrational spectroscopy (FTIR and Raman) and thermal analysis are also covered.
關於作者
Yang Leng is a Professor of Materials Science at Hong Kong University of Science and Technology. His research focuses on mechanical behavior of engineering materials, biomedical materials, and novel materials processing. Professor Leng has authored nearly 80 papers in international journals and has been granted two US patents. In addition, he commissioned more than a dozen industrial reports. His contribution to teaching materials science is exemplified by the Teaching Excellence Appreciation award from the HKUST.
為這本電子書評分
請分享你的寶貴意見。
閱讀資訊
智能手機和平板電腦
手提電腦和電腦
你可以使用電腦的網絡瀏覽器聆聽在 Google Play 上購買的有聲書。
電子書閱讀器及其他裝置
如要在 Kobo 等電子墨水裝置上閱覽書籍，你需要下載檔案並傳輸到你的裝置。請按照說明中心的詳細指示，將檔案傳輸到支援的電子書閱讀器。
